Can we save a cookie?

We use cookies to enhance your experience on our website, target content and statistics. Read more about cookies

Material analysis with x-rays and neutrons - Surfaces

Hanna  Leemreize

Your Contact

Contact me

Indtast venligst et validt navn
Or your phone number
?
Thank you for your message
Vi beklager

På grund af en teknisk fejl kan din henvendelse desværre ikke modtages i øjeblikket. Du er velkommen til at skrive en mail til Send e-mail eller ringe til +45 72 20 26 02.

Metalemner med glatte og ru overflader

Material analysis with x-rays and neutrons - Surfaces

Structures and coatings on surfaces can determine properties such as hydrophobicity, adsorption, corrosion, and electrical properties. Surface analyses with X-rays and neutrons can give access to unique understanding that can help to optimize properties for specific applications, such as water-repellant surfaces, surfaces inhibiting bacterial growth, or electrically conducting surfaces.

Chemical composition

The chemical composition of a surface can be determined with X-ray spectroscopy. By scanning a focused x-ray beam over a surface, it is possible to map the distribution of the components with a resolution down to less than 100 nanometers.

  • Elemental composition and information on oxidation number and coordination to neighbor atoms can be investigated with the technique NEXAFS/XANES.
  • Chemical bonds and atomic distances can be analyzed with the technique EXAFS. Chemical bonds in a material can also be investigated with techniques such as Raman and IR spectroscopy.

CASES: (in Danish)

Optimering af overfladebelægninger gennem avanceret røntgenanalyse

Renere skibsrøg ombord på Poul Løwenørn

Nanostructure
Surfaces can exhibit a range of nanostructures, such as thin film layers, nanoparticles, fibres, or pores. X-ray and neutron analyses of these typically cover several square centimeters and give information on the average structure within this area, as opposed to the techniques AFM and SEM, where a smaller section of the sample is scanned.

  • Structure, fine layers, and roughness of layers on a flat substrate or at an interface inside a material can be determined with sub-nanometer precision using reflectometry.
  • Order and distance between particles in surfaces can be determined with grazing incidence scattering (GI-SAXS or GI-SANS).

Structure of surface films or membranes with thicknesses above a few micrometers, can be investigated using the same principles as for other solid materials.

Contact our experts to discuss solutions for your specific case.