Microstructure and elemental analysis - Methods

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Microstructure and elemental analysis - Methods

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01. Scanning Electron Microscopy02. Methods03. Certification

At the Danish Technological Institute, we have one of Denmark's most well-equipped characterization laboratories.

The laboratory includes:

  • 3 scanning electron microscopes from Zeiss (Zeiss Sigma 300, Zeiss Sigma 500, Zeiss CrossBeam (FIB/SEM)). All electron microscopes are equipped with X-ray microanalysis (EDX) equipment from Oxford
  • Infrared spectroscopy (FT-IR) from Thermo Fisher
  • Refractive index determination of glass samples (GRIM3)
  • X-ray Photoelectron Spectroscopy (XPS)
  • X-ray microtomography (µCT Scan)
  • Powder X-ray diffraction (PXRD)
  • Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
  • Gas chromatography / mass spectrometry (GC-MS)
  • Light microscopes from Zeiss
  • Cryo-microtomy