Defects below the surface - Peel back the surface of your product with FIB-SEM

Erik  Wisaeus

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Defects below the surface - Peel back the surface of your product with FIB-SEM

The cause of surface defects is often found below the surface. At the Danish Technological Institute, we can accurately produce cross-sections of the outermost surface and provide you with knowledge about your product's internal structure.

Companies involved in the development and production of surface coatings occasionally experience visual defects on the finished surfaces. At the Danish Technological Institute, based on studies of several hundred defective samples, we know that there can be many causes for these defects. Some errors occur when a foreign particle becomes trapped either in the final coating or on the surface of the product before coating. Other visual defects can arise when an object with small surface cracks is coated.

Experts in material analysis

We have the equipment and expertise to identify unknown particles (with a diameter as small as 1/100 of a hair's width) and perform subsequent chemical identification of them.

With our ion beam electron microscope (FIB-SEM), we can create thin cross-sections in the outermost surface of all types of solid materials. These cross-sections are accurately positioned within a few micrometers. Therefore, we can provide you with precise answers regarding the appearance of your samples beneath the surface.

Stay at the forefront of development

At the Danish Technological Institute, we have many years of experience in material characterization. We have one of Denmark's largest laboratories for surface analysis, where our FIB-SEM, among other techniques, can provide you with unique knowledge about your material.

Our laboratory for production control offers a wide range of analysis techniques: light microscopy, scanning electron microscopy (SEM/EDX, FIB/SEM), infrared spectrometry (FT-IR), photoelectron spectroscopy (XPS), X-ray diffraction (XRD), Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS), and micro CT scanning (µCT). Read more about the application of the various analysis techniques.

How can we assist you?

  • Visualizing the internal and external structure of surfaces, surface coatings, and particle samples
  • Identifying internal and external structures as well as chemical composition in local defects, such as small cracks and enclosed particles
  • Comparing layer thicknesses, porosity, adhesion, and chemical composition of surface coatings
  • Measuring layer thicknesses of layers ranging from approximately 100 nm to 1 mm
  • Identifying unknown materials through accredited testing
  • Examining the three-dimensional internal structure of your material through micro CT scanning


Contact our specialist, Erik Wisaeus, if you want to learn more about our expertise in surface analysis. You can reach Erik at phone number: 7220 2681 or email: