Microstructure and elemental analysis - Scanning Electron Microscopy

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Kathrine Bjørneboe

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Microstructure and elemental analysis - Scanning Electron Microscopy

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01. Scanning Electron Microscopy02. Methods03. Certification

At the Danish Technological Institute, we offer SEM/EDX (Scanning Electron Microscopy) examinations on all types of solid and soft materials.

These examinations can identify and visualize the micro/nano-structures of materials, as well as determine the elemental composition at points down to approximately 1 x 1 µm, and in some cases, even in individual nanoparticles.

As a customer, you are always invited to participate in the examinations. Our experience shows that this provides the most optimal conditions for a good collaboration and a satisfactory solution to the task.

We have over 20 years of experience in advanced material examinations, including SEM/EDX. We have been audited and approved for this type of examination by several of the largest pharmaceutical companies in Denmark.

Our mailing address for receiving material samples for analysis:

Danish Technological Institute
Nanoproduction and Microanalysis (C033)
Attn: Kathrine Bjørneboe (KBJ)
Gregersensvej 1, DK-2630 Taastrup

If you have any questions about our methods, please feel free to contact Kathrine Bjørneboe at 7220 3305 or kbj@teknologisk.dk.

Kollage over strukturel og grundstofanalyse af partikler ved SEM-EDX

How can the Danish Technological Institute assist you?

Through SEM/EDX examinations, it is possible to:

  • Visualize and document surface structures on a micro/nano-scale.
  • Determine the distribution of micro/nano-particles within a material.
  • Map air voids or foreign particles beneath the outer surface of an object.
  • Document and visualize the morphology of particle samples, including tendencies for agglomeration.
  • Map the elemental distribution of cross-section samples or surfaces.
  • Identify unknown samples (materials, particles, coatings) based on structure and elemental composition.
  • Determine the thickness of nano/micrometer-thick layers on surfaces.